Thin Film Thickness Monitor

Quartz crystal monitor for real-time deposition rate and thickness control.

Thin Film Thickness Monitor

Temperature Controllers

Thin Film Thickness Monitor

The Thin Film Thickness Monitor measures deposition rate and film thickness in real time using a quartz crystal sensor, with programmable material densities, setpoint outputs and shutter control for repeatable coatings.

Key Features

  • Real-time rate and thickness display
  • Stored material density library
  • Shutter and setpoint relay outputs
  • RS-232 / USB data logging

Applications

Deposition controlOptical coatingResearch labs

Technical Specifications

Product TypeQuartz crystal monitor
Resolution0.1 Å
Sensor6 MHz gold quartz crystal
Channels1 – 2 sensors
OutputsRelay, analog, digital
Power Requirement230 V, 50 Hz
Available ModelsSingle & dual sensor
Support AvailableCalibration, AMC

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